This instrument offers the broadest range of AFM modes and applications (Tapping, Contact, Phase Imaging) and is equipped with the proprietary ScanAsyst® automatic image optimization technology, which enables easier, faster, and more consistent results, regardless of user skill level.
Delivering highest performance on any AFM sample
• High resolution (lateral 5-10 nm)
• Reduced noise (< 30 pm)
Providing quantitative nanoscale material property mapping
• Nanomechanical properties
• Electrical characterization
• Tunneling Atomic Force