Production of high quality CVD graphene with in-house customized procedures. The end product fulfills a variety of our requirements for large-scale graphene samples.
X-ray photoelectron spectroscopy (XPS) is a surface analysis technique capable of providing elemental and chemical state information from the outer 5 to 12 nanometres of a solid surface. All elements can be detected with detection limits in the 0.1 to 0.5 atomic percent.
It is simple to operate yet delivers outstanding performance and reliable results, for even the most challenging experiments. You can produce both rich, detailed, chemical images and highly specific data from discrete points. The Renishaw inVia offers unparalleled flexibility.