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Renishaw inVia Raman

Resources Thursday, 14 March 2019 09:14

Raman Spectroscopy combined with AFM

It is simple to operate yet delivers outstanding performance and reliable results, for even the most challenging experiments. You can produce both rich, detailed, chemical images and highly specific data from discrete points. The Renishaw inVia offers unparalleled flexibility.

Reliable Performance

The highly efficient optical design provides the best Raman data, from minute traces of material and large volumes. Measurements such as the follwoing can be performed:

  • time series: monitor how a sample is altering with time
  • temperature ramps: use a hot/cold cell to see phase changes
  • line scans: profile a sample, both across the surface, or into its depth
  • area mapping: generate images, either horizontally at fixed focus, following the surface topography, or from vertical slices
  • volume scans: produce 3D views of a transparent sample's internal structure
  • transmission mapping: analyse large volumes of material and produce depth-averaged 2D images of bulk material homogeneity
  • specialist measurements: trigger data collection from peripheral equipment (such as a control system on a synchrotron beamline)

Flexibility adaptable to specific experimental requirements

The Renishaw inVia can be tuned to best suit research and experimental needs. The facilities offer a modest range of lasers, and a wide range of optical components and accessories.

Fully automated

The Renishaw inVia offers flexibility and capability without complexity. Graduate and postgraduate students regularly perform experiments and take measurements, after having succesfully followed a suitable training course. Precision automated assemblies enable inVia to complete common tasks—such as switching laser wavelength, changing diffraction grating, and acquiring a Raman image—rapidly, simply, reliably, and without the need for manual intervention. This is essential for busy laboratories with multiple users.

Concentrate on the science, not adjusting the instrument.

Last modified on Sunday, 24 March 2019 10:51