This instrument offers the broadest range of AFM modes and applications (Tapping, Contact, Phase Imaging) and is equipped with the proprietary ScanAsyst® automatic image optimization technology, which enables easier, faster, and more consistent results, regardless of user skill level.

Delivering highest performance on any AFM sample
•    High resolution (lateral  5-10 nm)
•    Reduced noise (< 30 pm)

Providing quantitative nanoscale material property mapping
•    Nanomechanical properties
•    Electrical characterization
•    Tunneling Atomic Force